In-Situ Characterization

In-situ Characterization Technique at UW IBL

UW IBL is capable to conduct in-situ surface characterization through techniques including Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA), Particle-induced X-ray emission (PIXE), and Nuclear Reaction Analysis (NRA). These techniques allows users to do compositional, structural, particle penetration depth, and other material properties analysis. More details about these techniques can be found in the reference papers and project slides below

Reference materials and examples of in-situ characterization

 

Presentation: “DIONISOS: A new experiment studying the dynamics of plasma-surface interactions” ~ PDF

Dennis Whyte, Graham Wright, Alan Hoskinson, University of Wisconsin – Madison, PFC Meeting at University of Illinois, May 2004

Presentation: “Ion Beam Analysis of PISCES Graphite Tiles at the UW-Madison Accelerator/PSI Lab” ~ PDF

Dennis Whyte, University of Wisconsin-Madison, PSIF Workshop at ORNL, March 2005

“Differential cross-section of the D(3He,p)4He nuclear reaction and depth profiling of deuterium up to large depths”

V.Kh. Alimov et al. / Nucl. Instr. and Meth. in Phys. Res. B 234 (2005) 169–175

“The deuterium depth profile in neutron-irradiated tungsten exposed to plasma”

Masashi Shimada, G Cao, Y Hatano, T Oda, Y Oya, M Hara, P Calderoni1 Phys. Scr. T145 (2011)

Analysis beam line terminal